Electronics-Lab.com shares a hot tip on protecting USB circuits during manufacturing tests and it can be used in other measurement and automation applications.
Applications notes like this have been indispensable in designing the T400 temperature datalogger, for which we used TVS diodes and a thermal fuse.
USB data-acquisition modules offer good value and ease of use, which makes them an attractive choice for manufacturing test. But before you use the modules in a manufacturing test system, you need to take steps to protect them. During manufacturing test of circuit boards or subassemblies, a defect in an assembly may result in a condition that damages a data-acquisition module.